Naif, Y.H. , Awni , M. , Mufeed, A. and Khan, M.A.-R. 2025. Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform. International Journal of Innovative Research and Scientific Studies. 8, 7 (Oct. 2025), 738–748. DOI:https://doi.org/10.53894/ijirss.v8i7.10531.