Naif, Y. H. ., Awni , M. ., Mufeed, A. ., & Khan, M. A.-R. . (2025). Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform. International Journal of Innovative Research and Scientific Studies, 8(7), 738–748. https://doi.org/10.53894/ijirss.v8i7.10531