NAIF, Y. H. .; AWNI , M. .; MUFEED, A. .; KHAN, M. A.-R. . Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform. International Journal of Innovative Research and Scientific Studies, [S. l.], v. 8, n. 7, p. 738–748, 2025. DOI: 10.53894/ijirss.v8i7.10531. Disponível em: https://www.ijirss.com/index.php/ijirss/article/view/10531. Acesso em: 5 dec. 2025.