Naif, Yasir Hashim, Marwa Awni, Abdullah Mufeed, and Mohd Abdul-Rahim Khan. 2025. “Design and Manufacturing of Digital Integrated Circuits Tester at gate/Flip Flop Level Using Arduino Mega Platform”. International Journal of Innovative Research and Scientific Studies 8 (7):738-48. https://doi.org/10.53894/ijirss.v8i7.10531.