Naif, Y. H. ., Awni , M. ., Mufeed, A. . and Khan, M. A.-R. . (2025) “Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform”, International Journal of Innovative Research and Scientific Studies, 8(7), pp. 738–748. doi: 10.53894/ijirss.v8i7.10531.