Naif, Yasir Hashim, Marwa Awni, Abdullah Mufeed, and Mohd Abdul-Rahim Khan. “Design and Manufacturing of Digital Integrated Circuits Tester at gate/Flip Flop Level Using Arduino Mega Platform”. International Journal of Innovative Research and Scientific Studies 8, no. 7 (October 6, 2025): 738–748. Accessed December 5, 2025. https://www.ijirss.com/index.php/ijirss/article/view/10531.