Naif YH, Awni M, Mufeed A, Khan MA-R. Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform. ijirss [Internet]. 2025 Oct. 6 [cited 2025 Dec. 5];8(7):738-4. Available from: https://www.ijirss.com/index.php/ijirss/article/view/10531